What's new at Savvy Optics? - SavvyBlog
Half day Scratch-Dig
Software Assisted
Scratch Inspection
using the
Welcome to SavvyBlog!

I've collected together links to some of the more popular
papers we've done as well as our previous posts to the
"what's new" section on our index page.
Full Day ISO 10110 Class

(c) 2015-2017 Savvy Optics Corp.  All rights reserved.
Full day Cleaning,
Inspection, and
Scratch-Dig Class
D-668 comparison samples
Davidson Optronics
D-668 comparison set
Previous posts from the "What's new" section

June 22nd, 2015

DSS show went great!  Thanks everyone for coming by!

I just got word that we will be teaching an entire session of standards classes at OptiFab in
Rochester this coming October.  I will post more information later this month.

March 3rd, 2015

Looking forward to the SPIE DSS show in Baltimore in April.  We will be exhibiting, showing off the
latest software for the SavvyInspectorTM SIF4E.  See you there on the show floor!

February 27th, 2015

After many requests, we have decided to go ahead and offer our entire series of classes out in
southern California in May this year.  This is your big chance to check out our brand new class
"A practical guide to specifying optics."  Or you can come to one of our many popular classes on
Scratch and Dig inspection, Waviness, or ISO 10110 drawings.  You can sign up
here, or just
click the "Register" link above.  I'm really looking forward to this!
December 31st, 2014

This month we welcomed Lithuania into the family of countries with SIF-4 systems.  Dave went
and installed a system at Altechna in Vilnius, Lithuania, for the first installation in the Baltic
States.  Vilnius was beautiful and the people were wonderful; hopefully we'll get to go back for
another installation soon.

October 30th, 2014

Thanks, everyone, who helped to make our training classes in Rochester a success!  We had
more than 20 people attend, and all the classes went really well.  We will plan to do more of
these self-sponsored events in the future.

August 15th, 2014

Getting ready to go to Berlin for EOSAM and then the big standards meeting there.  This is the
general meeting of TC172, Optics and Photonics, along with a joint meeting of TC172 SC1
Fundamental Standards, and TC172 SC5 Microscopes and Endoscopes.  We are really excited
about it because both our proposed new work items have been accepted by the committee!  
There is a lot of hard work to do, but in a couple of years we will have an ISO version of the
American scratch and dig standard added to the ISO 10110 drawing notation standard, as well
as a complete overhaul of ISO 14997 for inspection methods for surface imperfections.  Cool
stuff!  Who says standards are boring?
September 30th, 2013

Another great set of meetings for ISO TC172 SC1.  The US hosted the meetings at NIST Gaithersburg,outside of
Washington D. C .We made great progress on the German initiative to incorporate generalized surface
descriptions for freeform optical surfaces into the standard, as well as some healthy discussions on new ways to
create tabulated drawings.  We also discussed how to move forward with an overhaul of the surface imperfection
standard, hopefully to create a grand, unified surface imperfection standard!

September 4th, 2013

At long last, we've updated the ANSI accumulator.  The 2013 version has two sheets in the workbook; one for
visibility specifications (ANSI OP1.002 visibility or MIL-PRF-13830B), and one for dimensional specifications (ANSI
OP1.002 dimensional, or MIL-C-48497A.)  Feel free to download the new version, to the right.  As always, this is
offered free and without warranty.
ISO standards by Max Levy Autograph, and thanks to our new
partner, Gage-Line, the entire suite of optical comparison
standards made for OP1.002 dimensional inspection. I was
thrilled to be helped out in the booth by Mike Hotkowski (not
shown) and my daughter, Rocky Aikens (left), as well as Savvy
Optics' production manager, Dana Takaki (right).  We also had
Frank Dombrowski of Gage-Line in the booth for much of the
time to show off the new dimensional products.  With the addition
of the Gage-Line partnership, Savvy Optics now has a complete
line of solutions for every scratch and dig inspection need!
The IODC conference at Kona was fantastic.  We had a great time
enjoying the Kona coast and talking about the cutting edge of optical
design, illumination, computational imaging, and optical fabrication.  
Savvy Optics Corp. published a paper jointly with our client
Electrix, Inc.
on the development of the double airwing luminaire that is now sold by
Electrix as the
i400.  We also co-authored two more papers on standards
and standarization with Rich Youngworth of
RiYo LLC and Sven Kiontke
Asphericon.  Now we're back to working on the motorized system, the
SIF-4M which we expect to start shipping this fall.
Catch up on old postings in the SavvyBlog:

SavvyBlog 2013

SavvyBlog 2012

SavvyBlog 2011 and prior
Papers and Articles archive

NY Photonics Articles
April 2010 - New aspheric equation
March 2010 - The truth
Sept 2009 - New high index glasses
July 2009 - PVr A robust Peak-to-Valley specification
May 2009 - Roughness; the forgotten specification
April 2009 - New version of Scratch/Dig spec: OP1.002:2009
March 2009 - ASC/OP releases ISO 10110 as American National Standard

"Recent" technical papers
2012 Objective Scratch and Dig measurement - Takaki
OptiFab 2011 Default tolerances
IODC 2010 Meaningful roughness and quality specifications
OF&T 2010 The truth about Scratch and Dig
Optics and Photonics 2009 - The cost of tolerancing
OptiFab 2009 - Software assisted scratch inspection
OF&T 2008 - MSF Ripple Paper
OF&T 2008 - MSF Ripple Presentation
July 15th, 2014

February 24th, 2014

Big thank you to Ornit Hadar at Kodak Graphic Communications in Canada for finding an error in the ANSI
dimensional side of the SavvyAccumulator.  The accumulation of small scratches was incorrect.  I have fixed
it, and you can download the new version
here, and from the side bar as usual.

February 10th, 2014

Just back from Photonics West.  Another excellent show, with great products and meetings.  We had
meetings of most of the task forces of ANSI ASC OP, the optics standards body for the USA, as well as a
meeting of the American Technical Advisory Group for ISO TC172, and the general meeting of OEOSC.  I
also taught the Scratch and Dig Class and the Advanced Inspection workshop.  All good stuff!  Now I need to
write my papers for OF&T and IODC in Hawaii.

October 22nd, 2013

Just back from OptiFab.  What a great show!  We were exhibiting the new megapixel SavvyInspectorTM
SIF4E, the Davidson D-668 visibility standards,