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What's new at Savvy!
March 4th, 2013
The first flight of D-668 comparison samples are already sold out. Thank you everyone for the
enthusiastic response. Looks like we have a winner. We'll need to make another flight right
away, so if you want a Davidson-style comparison set that is certified using the same process
as the offical sets made by the Army, contact me for pricing. I'd like to get these going before
the end of March, so don't delay. The data sheet is here, if you need one.
January 31, 2013
New Davidson Scratch and Dig Comparison Standards!
Great news: The new re-mastered Davidson comparison standards, D-668, are now available. I just got
my first four sets today, and they look great. I haven't had time to measure them all, but I put the first set
on my Demo SavvyInspectorTM here (SN 7126), and sure enough, they are spot on to the lower end of
each of the scratch standard ranges, compliant to the US Army ARDEC limits.
We now have a set of comparison standards that are repeatable, calibrated using a SavvyInspectorTM,
and traceable back to the Army limit standards. These can be used for either MIL-PRF-13830B or
ANSI/OEOSC OP1.002-2009 Visibility scratch and dig inspections.
To get your own set, either contact me or contact Davidson directly. Be sure to order the D-668 set, not
the Rev H D-667 set. They are more expensive, but you won't be sorry; they are excellent, conservative,
up to date samples. Great job, Davidson!
December 11, 2012
Dana has written a technical paper describing how to use a SavvyInspectorTM to do surface quality
inspections, called "Objective scratch and dig measurement." In in she describes the new SIF4 software
and the exact methodology for making repeatable, objective measurements. Check it out!
to make is how to define "freeform" optics. All good stuff, and I think we can expect some significant
improvements to ISO 10110 in 2013 and 2014.
In February we will continue our discussions on adoption of the ISO notation through the National
Adoption of an International Standard (NAIS) process. We want to release the US version by the end of
2013, at least with the fundamental sections. Come by the OEOSC Meetings at Photonics West to hear
first-hand what is going on.
October 12, 2012
It's been a busy month. We just installed the third Series 5 system in Chicago. The first one is a lease
system we retro-fitted, that is now in CA. The second series 5 system, SN7125, which was installed in
Rochester last month, was also the first system built here in CT by Dana. The new software is a big
improvement, and offers ISO mode for general imperfections, in addition to the MIL and ANSI inspection
capability. If you are a series 3 or 4 SavvyInspectorTM owner and want to get the latest software, contact
me to get started.
October 1, 2012
Finally finished the new proposed draft of ISO 10110-7 and ISO 14997 which includes the ANSI Scratch
and Dig method as well as the existing DIN 3140 based method for surface imperfections. We'll be
presenting this at the TC172/SC1 meeting at St. Gallen later this month. Hopefully the committee will
agree that the approach is sound, and we can proceed with a working draft.
July 7, 2012
I'm very excited that version 5 of the SavvyInspectorTM SIF-4 software is now in beta testing! This update
cleans up a lot of issues associated with the image window, scratch length, and magnification, and also
gets far better results on very fat scratches or digs which are composed of multiple unresolved scattering
sources. The update also has a new mode to allow general imperfection grades to be reported according
to ISO 10110-7. It's still a scatterometer, not a digital microscope, so it gets the apparent size that you
would get from a DIN-style visual inspection, but that correlates nicely with expert inspector results anyway.
Check out this new video Dana made, with the latest software including ISO mode!
Catch up on old postings from 2011 and before in the SavvyBlog.
March 4th, 2013
The first flight of D-668 comparison samples are already sold out. Thank you everyone for the
enthusiastic response. Looks like we have a winner. We'll need to make another flight right
away, so if you want a Davidson-style comparison set that is certified using the same process
as the offical sets made by the Army, contact me for pricing. I'd like to get these going before
the end of March, so don't delay. The data sheet is here, if you need one.
January 31, 2013
New Davidson Scratch and Dig Comparison Standards!
Great news: The new re-mastered Davidson comparison standards, D-668, are now available. I just got
my first four sets today, and they look great. I haven't had time to measure them all, but I put the first set
on my Demo SavvyInspectorTM here (SN 7126), and sure enough, they are spot on to the lower end of
each of the scratch standard ranges, compliant to the US Army ARDEC limits.
We now have a set of comparison standards that are repeatable, calibrated using a SavvyInspectorTM,
and traceable back to the Army limit standards. These can be used for either MIL-PRF-13830B or
ANSI/OEOSC OP1.002-2009 Visibility scratch and dig inspections.
To get your own set, either contact me or contact Davidson directly. Be sure to order the D-668 set, not
the Rev H D-667 set. They are more expensive, but you won't be sorry; they are excellent, conservative,
up to date samples. Great job, Davidson!
December 11, 2012
Dana has written a technical paper describing how to use a SavvyInspectorTM to do surface quality
inspections, called "Objective scratch and dig measurement." In in she describes the new SIF4 software
and the exact methodology for making repeatable, objective measurements. Check it out!
to make is how to define "freeform" optics. All good stuff, and I think we can expect some significant
improvements to ISO 10110 in 2013 and 2014.
In February we will continue our discussions on adoption of the ISO notation through the National
Adoption of an International Standard (NAIS) process. We want to release the US version by the end of
2013, at least with the fundamental sections. Come by the OEOSC Meetings at Photonics West to hear
first-hand what is going on.
October 12, 2012
It's been a busy month. We just installed the third Series 5 system in Chicago. The first one is a lease
system we retro-fitted, that is now in CA. The second series 5 system, SN7125, which was installed in
Rochester last month, was also the first system built here in CT by Dana. The new software is a big
improvement, and offers ISO mode for general imperfections, in addition to the MIL and ANSI inspection
capability. If you are a series 3 or 4 SavvyInspectorTM owner and want to get the latest software, contact
me to get started.
October 1, 2012
Finally finished the new proposed draft of ISO 10110-7 and ISO 14997 which includes the ANSI Scratch
and Dig method as well as the existing DIN 3140 based method for surface imperfections. We'll be
presenting this at the TC172/SC1 meeting at St. Gallen later this month. Hopefully the committee will
agree that the approach is sound, and we can proceed with a working draft.
July 7, 2012
I'm very excited that version 5 of the SavvyInspectorTM SIF-4 software is now in beta testing! This update
cleans up a lot of issues associated with the image window, scratch length, and magnification, and also
gets far better results on very fat scratches or digs which are composed of multiple unresolved scattering
sources. The update also has a new mode to allow general imperfection grades to be reported according
to ISO 10110-7. It's still a scatterometer, not a digital microscope, so it gets the apparent size that you
would get from a DIN-style visual inspection, but that correlates nicely with expert inspector results anyway.
Check out this new video Dana made, with the latest software including ISO mode!
Catch up on old postings from 2011 and before in the SavvyBlog.
Savvy Optics is a privately held Connecticut
Corporation dedicated to serving the optics
community through optics standards, education
and training, and down-to-earth lens and product
design. We specialize in:
Optical design and engineering
Surface quality (scratch and dig)
Mid-spatial frequency waviness
Optics standards and specifications
Corporation dedicated to serving the optics
community through optics standards, education
and training, and down-to-earth lens and product
design. We specialize in:
Optical design and engineering
Surface quality (scratch and dig)
Mid-spatial frequency waviness
Optics standards and specifications
| Shortcuts to Popular Products and Courses |
Learn More About
November 21, 2012
ISO TC172 SC1 meetings in St. Gallen,
Switzerland went very well. The US
presented their proposed changes to ISO
10110-1, -10, and -7, as well as ISO 14997.
I think these changes are very important to
broader adoption of the drawing notation
standard. We also had some great
discussions on the changes needed to
allow us to specify aspheric optics more
completely. This requires a major overhaul
to the sections on surface form (Part 5) and
centering (Part 6) which is being led by the
German delegation. A key decision we need
ISO TC172 SC1 meetings in St. Gallen,
Switzerland went very well. The US
presented their proposed changes to ISO
10110-1, -10, and -7, as well as ISO 14997.
I think these changes are very important to
broader adoption of the drawing notation
standard. We also had some great
discussions on the changes needed to
allow us to specify aspheric optics more
completely. This requires a major overhaul
to the sections on surface form (Part 5) and
centering (Part 6) which is being led by the
German delegation. A key decision we need
| Savvy Optics is now taking orders for the Davidson Optronics D-668 comparison sample set. This set is re-mastered to match the brightness limit standards of the Picatinny Arsenal, using the Davidson Optronics Savvy InspectorTM |